Описание

Key Facts The R&S®AMU-K69 LTE closed-loop BS test option enables the test engineer to generate dynamically changing LTE baseband signals as required to perform HARQ feedback and uplink timing adjustment tests in line with the LTE base station conformance test specification 36.141 (chapter 8). The R&S®AMU-K69 option extends the R&S®AMU-K55 LTE option by:
  • Realtime response of the simulated UE to HARQ feedback commands (ACK/NACK) from the base station (= eNB)
  • Realtime response of the simulated UE to timing adjustment commands from the base station (= eNB)
Besides LTE signal generation and the capability to process realtime feedback, LTE closed-loop base station performance tests also require channel simulation. The R&S®AMU200A baseband signal generator and fading simulator is a complete baseband test solution. It combines dual LTE baseband signal generation, realtime multipath fading and AWGN simulation as well as realtime response to base station feedback for HARQ and uplink timing adjustment in a single instrument (additional options required). When used together with two additional vector signal generators for RF upconversion not only standard-compliant baseband tests but also RF tests can be performed. As an alternative solution, the R&S®SMU200A vector signal generator may be used. It offers the same functionality as the R&S®AMU200A plus additional dual-path RF upconversion in a unique one-box solution. Please see “R&S®SMU-K69 LTE Closed-Loop BS Test” for further details.
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